Description:This patent relates generally to the field of inspection systems. More particularly, This patent relates to a remote sensing device to detect materials of varying atomic numbers.
Abstract:A remote sensing device for detecting materials of varying atomic numbers and systems and methods relating thereto. A system for identifying a material includes a photon beam flux monitor for resolving a high-energy beam. A method for identifying a material includes casting an incident photon beam on the material and detecting an emerging photon beam with an array of fission-fragment detectors, a first set of scintillator paddles, and a second set of scintillator paddles.
Issue Date: 10/06/2009
Application Date: 10/27/2003
Post Date: 03/02/2018
UTEP Docket No: 2002-010
